Wolfspeed’s KIT-CRD-CIL17N-XM is a dynamic performance tool that can be used to evaluate and optimize switching performance of Wolfspeed’s 1700 V XM half-bridge power modules with 3
rd generation Silicon Carbide (SiC) MOSFETs. A clamped inductive load (CIL) test circuit with high-bandwidth current measurement provides a high-speed, low-inductance test fixture for double pulse testing. This test fixture in conjunction with one of the many gate driver board options allow for measurement of:
- Timing (TDelay-On; TDelay-Off; TRise; TFall)
- Overshoot (VDS-Max; ID-Max)
- Speed (di/dt; dv/dt)
- Switching Loss (EON; EOFF; ERR)
