Renewable Energy

Dynamic Characterization and Measurement Methods

Austin Curbow
Oct 22, 2021
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Dynamic Characterization and Measurement Methods

This whitepaper is for engineers looking to improve their test methodology for high-speed Silicon Carbide (SiC) power devices. A clamped inductive load (CIL) test is a simple, low-cost evaluation tool that enables design engineers to quickly gain insight into the dynamic switching behavior of Wolfspeed’s SiC MOSFETs. From a comprehensive understanding of basic circuit fundamentals to SiC-specific guidelines, this whitepaper will explore the CIL test as a valuable investigative tool to introduce or optimize the performance of Wolfspeed power modules. This session will serve as an introduction to double pulse testing and instrumentation recommendations for SiC. Learn comparisons between unipolar and bipolar gate driving, active Miller clamping, gate resistor selection using RBSOA, and how to use best-practice power and gate signal layouts to optimize SiC’s dynamic performance.

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